SN74BCT8244ADWE4
N/A
Deutsch
Ship From: Hong Kong
Anzahl | Einzelpreis |
---|---|
50+ | $10.3248 |
Online -RFQ -Einreichungen: Schnelle Antworten, bessere Preise!
Produkteigenschaften | Eigenschaften |
---|---|
Versorgungsspannung | 4.5 V ~ 5.5 V |
Supplier Device-Gehäuse | 24-SOIC |
Serie | 74BCT |
Verpackung | Tube |
Verpackung / Gehäuse | 24-SOIC (0.295", 7.50mm Width) |
Betriebstemperatur | 0°C ~ 70°C |
Anzahl der Bits | 8 |
Befestigungsart | Surface Mount |
Produkteigenschaften | Eigenschaften |
---|---|
Feuchtigkeitsempfindlichkeitsniveau (MSL) | 1 (Unlimited) |
Hersteller Standard Vorlaufzeit | 6 Weeks |
Logiktyp | Scan Test Device with Buffers |
Bleifreier Status / RoHS-Status | Lead free / RoHS Compliant |
detaillierte Beschreibung | Scan Test Device with Buffers IC 24-SOIC |
Basisteilenummer | 74BCT8244 |
SN74BCT8244ADWE4 Einzelheiten PDF [English] | SN74BCT8244ADWE4 PDF - EN.pdf |
IC SCAN TEST DEVICE BUFF 24-DIP
IC SCAN TEST DEVICE BUFF 24-SOIC
IC SCAN TEST DEVICE BUFF 24-DIP
IC SCAN TEST DEVICE BUFF 24-SOIC
IC SCAN TEST DEVICE BUFF 24-DIP
TI 24-SOIC
IC SCAN TEST DEVICE LATCH 24SOIC
IC SCAN TEST DEVICE TXRX 24-DIP
IC SCAN TEST DEVICE TXRX 24-SOIC
IC SCAN TEST DEVICE BUFF 24-DIP
IC SCAN TEST DEVICE LATCH 24SOIC
IC SCAN TEST DEVICE LATCH 24SOIC
IC SCAN TEST DEVICE TXRX 24-SOIC
IC BUFFER NON-INVERT 5.5V 20SO
IC SCAN TEST DEVICE TXRX 24-DIP
IC SCAN TEST DEVICE BUFF 24-SOIC
IC SCAN TEST DEVICE BUFF 24-SOIC
IC SCAN TEST DEVICE BUFF 24-SOIC
IC SCAN TEST DEVICE 24SOIC
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